Wafer Test Division

Services and Support

• Emergency repair for down systems

• Installation assistance – (also equipment audit and decommissioning service)

• Preventative maintenance and annual service contracts

• Semi standard certified training courses – same criteria as OEM training

• Spare Parts

Equipment Sales

• Refurbishment centres in Scotland and Taiwan

• Extensive range of quality used 200 and 300mm Probers

• Modification and H/W upgrade expertise

TEST Process and Application Support

Improving throughput, extending the life cycle of your probe card, or test data

analysis tools : We can help -

• Tester/prober communication analysis (GPIB,RS232)
• Versatile binning and result map systems
• Wafer map conversion - for any formats (STDF, ATDF, WAT, PCM, etc)
• Test data analysis systems (MEAN, Median, Sigma, range, Cp,Cpk, yield)
• Equipment networking – HSMS/SECS/GEM communication
• Temperature probing – optimisation for hot/cold probing
• Probe card polish optimisation

Tester Interfaces and Docking

Our docking hardware products are designed to accommodate a wide variety of ATE manufacturers' test heads, which, in turn, interface with numerous wafer probers and device handlers.

• Spring Probe test sockets, contactors & fixtures
• High performance sockets for RF test b/w >60GHz
• Compatible docking systems & handler change kits
• Test interface boards - global turn-key service
• Stiffeners and other semi test hardware
• Wafer probe interface towers
• Restoration of worn, contaminated board & socket contacts
• ATE for semiconductor, load board and BIB test

Any prober to any tester docking/interfacing modification.

CUSTOMER BENEFITS

• Cost effective test solutions, competitive with in-house.
• Minimise capitalisation cost and reduced overheads.
• Faster time to market.
• Extensive ATE experience across numerous technologies.
• Optimised ATE process equals higher yields, increased throughput and reduced cycle time.
• Production Support – failure analysis & drive pro-active yield improvement projects.
• Monitor product performance, data collection & analysis.
• Parametric wafer maps and stacking.
• Custom data reports - Automated analysis on each wafer looking for specified data “patterns”
• Web Reports - Allows remote intranet access to data via custom reports.